Department of Microelectronics
Faculty of Electrical Engineering, Mathematics, and Computer Science

Gabriel Daniel

Publications

  1. Simultaneous data collection of small maritime targets using multistatic radar and forward scatter radar
    Ritchie, Matthew; Fioranelli, Francesco; Woodbridge, Karl; Griffiths, Hugh; Daniel, Liam; De Luca, Alessandro; Hristov, Stanislav; Gashinova, Marina; Cherniakov, Mikhail;
    IET RADAR SONAR AND NAVIGATION,
    Volume 11, Issue 6, pp. 937-945, JUN 2017. DOI: 10.1049/iet-rsn.2016.0526

  2. Simultaneous Data Collection of Small Maritime Targets using Multistatic and Forward Scatter Radar
    Ritchie, Matthew; Fioranelli, Francesco; Woodbridge, Karl; Griffiths, Hugh; Daniel, Liam; De Luca, Alessandro; Hristov, Stanislav; Gashinova, Marina; Cherniakov, Mikhail;
    In 2015 IEEE RADAR CONFERENCE,
    Inst Elect \& Elect Engineers; Geosci \& Remote Sensing Soc, pp. 203-208, 2015. IEEE Radar Conference, Johannesburg, SOUTH AFRICA, OCT 27-30, 2015.

  3. X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
    A. Daniel; Y. Zhuang; V. Holy; J. Stangl; S. Zerlauth; F. Schaffler; G. Bauer; N. Darowski; U. Pietsch;
    Nuclear Instruments and Methods Physics Research B,
    Volume 200C, pp. 267-272, 2003.

  4. GID study of strains in Si due to patterned SiO2
    A. Daniel; V. Holy; Y. Zhuang; T. Roch; J. Grenzer; Z. Bochnicek; G. Bauer;
    Journal of Physics D (Applied Physics),
    Volume 34, Issue 10, pp. 197-202, 2001.

  5. Optical and structural properties of Si/SiGe wires grown on patterned Si substrates
    Y. Zhuang; A. Daniel; C. Schelling; F. Sch�ffler; G. Bauer; J. Grenzer; S. Senz;
    Thin Solid films,
    Volume 380, pp. 51, 2000.

  6. Structural and optical properties of Si/Si1-x Gex wires
    Y. ZC. Huang Schelling; J. Stangl; C. Penn; S. Senz; F. Sch�ffler; A. Daniel; U. Pietsch; G. Bauer;
    Thin Solid films,
    Volume 369, pp. 409, 2000.

  7. Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction
    Y. ZC. Huang Schelling; T. Roch; A. Daniel; F. Schaffler; G. Bauer; J. Grenzer; U. Pietsch; S. Senz;
    In Mat. Res. Soc. Symp. Proc.,
    pp. 207, 2000.

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